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X-Series Page Power/Analog Testing Microcontroller Testing ASSP/ASIC Testing RF PA/FEM/XCVRs Testing Data Converter Testing
  • Blog
    LTXCTM has been a leading provider of semiconductor test solutions for over 30 years. Through our blog we plan to share our knowledge in semiconductor test. It is intended to be a central discussion point for semiconductor test related issues. Read more about the blog.

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  • News and Events
  • April 23, 2013
  • Product Announcement: LTXC Introduces the VSX, A High Voltage Instrument for the ASLx
  • March 12, 2013
  • LTX-Credence Announces the Selection of the Diamondx Tester by Texas Instruments for Microcontroller Device Testing
  • February 27, 2013
  • LTX-Credence Announces Second Quarter Results
  • January 8, 2013
  • LTX-Credence Announces the Selection of PAx Tester by Shimane Masuda Electronics
  • Japan Based OSAT Adds PAx Test Capacity to Support Its Strategic Customers
  • December 10, 2012
  • LTX-Credence Announces Nighthawk(CT), the New Low Cost Benchmark for Connectivity Device Testing
  • Nighthawk Provides Benchtop Portability With the Performance of High Volume Manufacturing ATE
  • December 6, 2012
  • LTX-Credence Announces the Shipment of the 750th Diamond Test System
  • Sigurd Microelectronics Adds Diamondx Test Capacity to Support Its Strategic Customers
About LTXC

Company Overview

Leadership

Fast Facts

LTXC in the Community

Working @LTXC

Quality

Terms of Use

Blog
Solutions

Microcontroller Testing

Power Management Testing

ASSP/ASIC Testing

RF PA / FEM Testing

Data Converter Testing

ASL Platform

Diamond Platform

Diamondx Test System

Nighthawk - An ATE Paradi...

X-Series Platform

The PAx RF PA/FEM System

Integrated Multi-system A...

Application Services

Support

Xpedite Global Assistance...

Training Center

System Problem Reporting

Legacy Systems

News

Press Releases

Newsletter

Investors
Contact