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  • Blog
    LTXCTM has been a leading provider of semiconductor test solutions for over 30 years. Through our blog we plan to share our knowledge in semiconductor test. It is intended to be a central discussion point for semiconductor test related issues and will not contain LTXC specific product information. Read more about the blog.

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  • News and Events
  • January 18, 2012
  • Pascal Ronde Joins LTX-Credence as Vice President of Global Field Operations
  • January 5, 2012
  • LTXC to Present at Needham Tech Conference
  • December 7, 2011
  • LTX-Credence Announces the Selection of Its PAx Tester as ANADIGICS' Preferred Test Platform
  • November 22, 2011
  • LTXC Announces First Quarter Fiscal Year 2012 Results
  • September 15, 2011
  • LTX-Credence Board Authorizes $25 Million for Stock Repurchases
  • July 13, 2011
  • LTX-Credence Announces Selection of X-Series by ELMOS Semiconductor AG for Testing Automotive ASICs and ASSPs
  • ELMOS to Use X-Series for Devices Across All Automotive End Markets
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About LTXC

Company Overview

Leadership

Fast Facts

LTXC in the Community

Working @LTXC

Quality

Terms of Use

Blog
Solutions

Microcontroller Testing

Power Management Testing

ASSP/ASIC Testing

RF PA / FEM Testing

Data Converter Testing

ASL Platform

Diamond Platform

X-Series Platform

The PAx RF PA/FEM System

Integrated Multi-system A...

Application Services

Support

Xpedite Global Assistance...

Training Center

System Problem Reporting

Legacy Systems

News

Press Releases

Newsletter

Investors
Contact